XY Grid Encoders Offer Higher Precision and Lower Cost for Position Control, Channel, SEMI, January 7, 1999, Vol. 12, No. 1 (click to go)
High Accuracy 360° Rotation Stage and Metrology Solution for NIST
A research and integration program was awarded to develop, test and
deliver a high accuracy rotation stage for X-ray diffractometry
applications to the National Institute of Standards and Technology
(NIST). The task was accomplished with a design that adapted several
standard components to accurately align the independent X-ray sample
and detector axes to a fixed inertial reference and developed a
metrology system that measures rotation angle with a resolution of
better than 0.027 arc-sec over one revolution.
Innovative Design
The completed system integrated two independently controllable
300-mm diameter rotary tables from Anorad (PLR-300) in a stacked
configuration for the X-ray sample and detector axes. Each axis uses
the sum of two diametrically opposed linear encoder sensors from OPTRA
(NanoScale Model B) whose signal is obtained from a metal tape encoder
scale wrapped around the circumference of each table. These encoders
provide positioning information in an A-quad-B format from a newly
designed signal processing board to a closed-loop servo controller (an
Anorad IDAC-3U). The use of two encoders to measure rotation angle for
each table serves the two-fold purpose of providing continuity at the
abutting of the encoder scale as well as completely canceling table
errors to the first order. Each axis also has an OPTRA home optical
sensor to provide a stable reference position as well as the
appropriate mounting hardware and brackets for an X-ray sample and
detector.
Results
Measured system performance is:
|
Parameter |
Result |
Positioning resolution |
0.027 arc-seconds |
Accuracy |
|
- short-term |
± 0.25 arc-seconds |
- maximum error, 360 degrees |
2.0 arc-seconds p-p |
Home sensor resolution |
0.027 arc-seconds |
Parallelism of two stages |
£0.0015 inches (38 microns) |
Collinearity of two stages (z-axis) |
£0.0006 inches (15 microns) |
|
The results of this work achieved a high accuracy rotation system
suitable for accurate X-ray diffractometry measurements. The developed
metrology systems are applicable to other high-accuracy, closed-loop
rotational measurements and stage control.
Precision Diamond Turning Lab Includes Submersed NanoScales
The Stanford Quiet Hydraulics Lab utilizes hydraulic means to deal
with vibration and temperature problems in precision machining.
Hydraulic bearing and actuators without seals can totally eliminate
backlash and/or stiction. With temperature controlled oil, uniform
temperature distribution throughout the machine can be achieved.
Submersing the NanoScale sensors in the temperature controlled oil was
achieved with a protective housing. This special effort assisted in
reducing thermal measurement error to a negligible level.
|
High Accuracy XY Metrology in a Manufacturing Environment
Although originally designed to operate in a “clean” environment,
OPTRA’s customer desired to use the NanoGrid system in a manufacturing
environment. The difference in environments made it more difficult to
control and eliminate some contaminants that resulted from the
manufacturing process. The customer also had a need to synchronize our
high-speed measurements with their built-in clock.
Working closely to customer specifications, OPTRA made custom
modifications to both the NanoGrid encoder and hi resolution
electronics to solve these problems. The resulting customized NanoGrid
system now works to within an accuracy of +/- 30 nanometers with
contaminants of up to 50 microns falling on the optical grid. The
NanoGrid is integrated into the customers’ system which sells for in
excess of $1 million.
|
|