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Metrology/Motion Control
  • XY Grid Encoders Offer Higher Precision and Lower Cost for Position Control, SEMI, Jan 1999, Vol. 12, No.1
  • High Accuracy XY Metrology in a Manufacturing Environment
  • High Accuracy 360 Rotation Stage for NIST
  • Precision Diamond Turning Lab includes Submersed NanoScale
  • Using OPTRA NanoGrid Planar Encoder for Machine Calibration
  • Real Time Calibration
  • Through the Lens Auto Focus
  • Delphi Automotive NanoGrid
       
    Laser Beam Steering
    • 10mm Clear Aperture Beam Steerer
    • 25mm Clear Aperture Beam Steerer
    • 120mm Clear Aperture Beam Steerer

      Laser Detection
      • Laser Event Recorder
           
      Instrumentation
      • Joint Service Lightweight Standoff Chemical Agent Detector (JSLSCAD)
      • IEEE Presentation on Homeland Security/Chemical Agent Detection
      • A Fabry-Perot Scanning Spectrometer for Standoff Chemical Detection
           



        OPTRA, Inc. 461 Boston Street, Topsfield MA 01983-1234
        fax: 978-887-0022 | sales: 978-887-6600 | e-mail: info@optra.com


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